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TVLSI
2010
14 years 4 months ago
2010
Abstract-- The operational characteristics of integrated circuits based on nanoscale semiconductor technology are expected to be increasingly affected by variations in the manufact...
EDBT
2008
ACM
15 years 9 months ago
2008
ACM
The top-k retrieval problem requires finding k objects most similar to a given query object. Similarities between objects are most often computed as aggregated similarities of the...
ISPASS
2008
IEEE
15 years 4 months ago
2008
IEEE
Although the best processor design for executing a specific workload does depend on the characteristics of the workload, it can not be determined without factoring-in the effect o...
DATE
2008
IEEE
15 years 4 months ago
2008
IEEE
— As the feature size of transistors gets smaller, fabricating them becomes challenging. Manufacturing process follows various corrective design-for-manufacturing (DFM) steps to ...
ISCAS
2007
IEEE
15 years 4 months ago
2007
IEEE
—This paper presents a DAC architecture built on parallel current-steering sub-DAC entities. Two main novelties are explored: flexibility and smartness. Firstly, a number of avai...