15 search results - page 3 / 3 » Fast transient power and noise estimation for VLSI circuits |
127
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DAC
2003
ACM
15 years 6 months ago
2003
ACM
In recent years, due to rapid advances in VLSI manufacturing technology capable of packing more and more devices and wires on a chip, crosstalk has emerged as a serious problem af...
112
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DFT
2004
IEEE
15 years 5 months ago
2004
IEEE
In this paper we analyze the performance of a mixed built-in-self-test (BiST) for RF IC digital transceivers, where a baseband processor can be used both as a test pattern generat...
126
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DAC
2005
ACM
15 years 3 months ago
2005
ACM
This paper proposes a fast decoupling capacitance (decap) allocation and budgeting algorithm for both early stage decap estimation and later stage decap minimization in today’s ...
VLSID
2005
IEEE
16 years 1 months ago
2005
IEEE
In this paper, we present a simple analytical equation for capturing phase errors in 3-stage ring oscillators. The model, based on a simple but useful idealization of the ring osc...
115
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ISLPED
2004
ACM
15 years 6 months ago
2004
ACM
We present a novel temperature/leakage sensor, developed for high-speed, low-power, monitoring of processors and complex VLSI chips. The innovative idea is the use of 4T SRAM cell...