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85
Voted
DATE
2006
IEEE
15 years 7 months ago
2006
IEEE
— In this paper, we present an analysis methodology to compute circuit node sensitivity due to charged particle induced delay (timing) errors, Soft Delay Errors (SDE). We define...
89
Voted
ICPP
1993
IEEE
15 years 5 months ago
1993
IEEE
:. In designing application-specific bit-level architectures and in programming existing bit-level processor arrays, it is necessary to expand a word-level algorithm into its bit-...
110
Voted
ACL
2003
15 years 2 months ago
2003
Kernel-based learning (e.g., Support Vector Machines) has been successfully applied to many hard problems in Natural Language Processing (NLP). In NLP, although feature combinatio...
96
Voted
CGO
2010
IEEE
15 years 7 months ago
2010
IEEE
Prior work has shown that reduced, ordered, binary decision diagrams (BDDs) can be a powerful tool for program trace analysis and visualization. Unfortunately, it can take hours o...
DATE
2007
IEEE
15 years 7 months ago
2007
IEEE
Due to reduction in device feature size and supply voltage, the sensitivity to radiation induced transient faults (soft errors) of digital systems increases dramatically. Intensiv...