3212 search results - page 134 / 643 » Faster Concept Analysis |
111
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MTDT
2003
IEEE
15 years 9 months ago
2003
IEEE
: Linked faults are very important for memory testing because they reduce the fault coverage of the tests. Their analysis has proven to be a source for new memory tests, characteri...
111
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CORR
1999
Springer
15 years 4 months ago
1999
Springer
We argue that grammatical analysis is a viable alternative to concept spotting for processing spoken input in a practical spoken dialogue system. We discuss the structure of the g...
137
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OR
2004
Springer
15 years 9 months ago
2004
Springer
The combination of process integration and Operations Research enables an integrated technique assessment and a subsequent process design. The application of Multi Objective Pinch...
118
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DFT
2002
IEEE
15 years 9 months ago
2002
IEEE
IDDQ test loses its effectiveness for deep sub-micron chips since it cannot distinguish between faulty and fault-free currents. The concept of current ratios, in which the ratio o...
142
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TSD
2007
Springer
15 years 10 months ago
2007
Springer
This paper describes a clustering method for organizing in semantic classes a list of terms. The experiments were made using a POS annotated corpus, the ACL Anthology, which consis...