42 search results - page 6 / 9 » Fault Detection Capabilities of Coupling-based OO Testing |
IJES
2006
14 years 9 months ago
2006
This paper describes novel methods of exploiting the partial, dynamic reconfiguration capabilities of Xilinx Virtex V1000 FPGAs to manage single-event upset (SEU) faults due to rad...
ICCAD
2010
IEEE
14 years 7 months ago
2010
IEEE
Extreme technology scaling in silicon devices drastically affects reliability, particularly because of runtime failures induced by transistor wearout. Currently available online t...
IOLTS
2008
IEEE
15 years 3 months ago
2008
IEEE
Present and future semiconductor technologies are characterized by increasing parameters variations as well as an increasing susceptibility to external disturbances. Transient err...
DAC
2006
ACM
15 years 10 months ago
2006
ACM
The delay fault test pattern set generated by timing unaware commercial ATPG tools mostly affects very short paths, thereby increasing the escape chance of smaller delay defects. ...
SRDS
2008
IEEE
15 years 3 months ago
2008
IEEE
Firewalls are the mainstay of enterprise security and the most widely adopted technology for protecting private networks. As the quality of protection provided by a firewall dire...