42 search results - page 9 / 9 » Fault Detection Capabilities of Coupling-based OO Testing |
110
Voted
ASPLOS
2010
ACM
15 years 8 months ago
2010
ACM
We present a general scheme for virtualizing main memory errorcorrection mechanisms, which map redundant information needed to correct errors into the memory namespace itself. We ...
105
Voted
DAC
2007
ACM
16 years 2 months ago
2007
ACM
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...