102 search results - page 10 / 21 » Fault Detection Likelihood of Test Sequence Length |
ISSRE
2002
IEEE
15 years 3 months ago
2002
IEEE
A number of strategies have been proposed for state-based class testing. An important proposal was made by Chow [5] and adapted by Binder [3]: It consists in deriving test sequenc...
VTS
2008
IEEE
15 years 4 months ago
2008
IEEE
With increasing IC process variation and increased operating speed, it is more likely that even subtle defects will lead to the malfunctioning of a circuit. Various fault models, ...
119
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ATS
1998
IEEE
15 years 2 months ago
1998
IEEE
This paper presents a new effective Built-In Self Test (BIST) scheme that achieves 100% fault coverage with low area overhead, and without any modification of the circuit under tes...
194
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SPIN
2012
Springer
13 years 25 days ago
2012
Springer
Since counterexamples generated by model checking tools are only symptoms of faults in the model, a significant amount of manual work is required in order to locate the fault that...
PIMRC
2008
IEEE
15 years 4 months ago
2008
IEEE
Abstract— In a slot-synchronized wireless communication system, a set of signature sequences can be derived by circularly shifting a base sequence with good auto correlation prop...