102 search results - page 12 / 21 » Fault Detection Likelihood of Test Sequence Length |
DATE
1999
IEEE
15 years 2 months ago
1999
IEEE
Test application time is an important factor in the overall cost of VLSI chip testing. We present a new ATPG approach for generating compact test sequences for sequential circuits...
94
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DAC
2000
ACM
15 years 11 months ago
2000
ACM
The effect of crosstalk errors is most significant in highperformance circuits, mandating at-speed testing for crosstalk defects. This paper describes a self-test methodology that...
DAC
2006
ACM
15 years 11 months ago
2006
ACM
The delay fault test pattern set generated by timing unaware commercial ATPG tools mostly affects very short paths, thereby increasing the escape chance of smaller delay defects. ...
ISSRE
2006
IEEE
15 years 4 months ago
2006
IEEE
Practical model validation techniques are needed for model driven development (MDD) techniques to succeed. This paper presents an approach to generating inputs to test UML design ...
103
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CODES
2010
IEEE
14 years 7 months ago
2010
IEEE
This paper presents an approach to system-level optimization of error detection implementation in the context of fault-tolerant realtime distributed embedded systems used for safe...