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» Fault Detection Likelihood of Test Sequence Length
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DATE
1997
IEEE
100views Hardware» more  DATE 1997»
15 years 2 months ago
On the generation of pseudo-deterministic two-patterns test sequence with LFSRs
Many Built-In Self Test pattern generators use Linear Feedback Shift Registers (LFSR) to generate test sequences. In this paper, we address the generation of deterministic pairs o...
Christian Dufaza, Yervant Zorian
ETS
2009
IEEE
79views Hardware» more  ETS 2009»
14 years 8 months ago
Concurrent Self-Test with Partially Specified Patterns for Low Test Latency and Overhead
Structural on-line self-test may be performed to detect permanent faults and avoid their accumulation. This paper improves concurrent BIST techniques based on a deterministic test ...
Michael A. Kochte, Christian G. Zoellin, Hans-Joac...
SIGSOFT
1998
ACM
15 years 2 months ago
Further Empirical Studies of Test Effectiveness
This paper reports on an empirical evaluation of the fault-detecting ability of two white-box software testing techniques: decision coverage (branch testing) and the all-uses data...
Phyllis G. Frankl, Oleg Iakounenko
HASE
2008
IEEE
15 years 4 months ago
An Interaction-Based Test Sequence Generation Approach for Testing Web Applications
Web applications often use dynamic pages that interact with each other by accessing shared objects, e.g., session objects. Interactions between dynamic pages need to be carefully ...
Wenhua Wang, Sreedevi Sampath, Yu Lei, Raghu Kacke...
ICCAD
1999
IEEE
115views Hardware» more  ICCAD 1999»
15 years 2 months ago
An approach for improving the levels of compaction achieved by vector omission
We describe a method referred to as sequence counting to improve on the levels of compaction achievable by vector omission based static compaction procedures. Such procedures are ...
Irith Pomeranz, Sudhakar M. Reddy