102 search results - page 6 / 21 » Fault Detection Likelihood of Test Sequence Length |
ISSRE
2006
IEEE
15 years 4 months ago
2006
IEEE
The widespread deployment of graphical-user interfaces (GUIs) has increased the overall complexity of testing. A GUI test designer needs to perform the daunting task of adequately...
VTS
1995
IEEE
15 years 1 months ago
1995
IEEE
This paper presents a new approach for on-chip test pattern generation. The set of test patterns generated by a pseudo-random pattern generator (e.g., an LFSR) is transformed into...
VTS
1997
IEEE
15 years 2 months ago
1997
IEEE
Accumulators based on addition or subtraction can be used as test pattern generators. Some circuits, however, require long test lengths if the parameters of the accumulator are no...
PTS
1993
14 years 11 months ago
1993
In the area of testing communication systems, the interfaces between systems to be tested and their testers have great impact on test generation and fault detectability. Several t...
ITC
1996
IEEE
15 years 2 months ago
1996
IEEE
This paper presents a low-overhead scheme for built-in self-test of circuits with scan. Complete (100%) fault coverage is obtained without modifying the function logic and without...