102 search results - page 8 / 21 » Fault Detection Likelihood of Test Sequence Length |
69
Voted
DFT
2003
IEEE
15 years 3 months ago
2003
IEEE
A new hybrid BIST scheme is proposed which is based on using an “incrementally guided LFSR.” It very efficiently combines external deterministic data from the tester with on-c...
101
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DSD
2005
IEEE
15 years 4 months ago
2005
IEEE
1 This paper presents a method for power-constrained system-on-chip test scheduling in an abort-on-first-fail environment where the test is terminated as soon as a fault is detecte...
DDECS
2007
IEEE
15 years 2 months ago
2007
IEEE
A method of generating test pairs for the delay faults is presented in this paper. The modification of the MISR register gives the source of test pairs. The modification of this r...
75
Voted
ICFP
2006
ACM
15 years 10 months ago
2006
ACM
A transient hardware fault occurs when an energetic particle strikes a transistor, causing it to change state. These faults do not cause permanent damage, but may result in incorr...
TCAD
2008
14 years 10 months ago
2008
At-speed functional testing, delay testing, and n-detection test sets are being used today to detect deep submicrometer defects. However, the resulting test data volumes are too hi...