259 search results - page 27 / 52 » Fault Tolerance for Manufacturing Components |
ISLPED
2007
ACM
14 years 11 months ago
2007
ACM
Negative bias temperature instability (NBTI) has become a dominant reliability concern for nanoscale PMOS transistors. In this paper, we propose variable-latency adder (VL-adder) ...
WORDS
2002
IEEE
15 years 2 months ago
2002
IEEE
The design and implementation of distributed real-time dependable systems is often dominated by non-functional considerations like timeliness, object placement and fault tolerance...
CORR
2010
Springer
14 years 9 months ago
2010
Springer
Abstract--This paper proposes a method for deriving formal specifications of systems. To accomplish this task we pass through a non trivial number of steps, concepts and tools wher...
VTC
2007
IEEE
15 years 4 months ago
2007
IEEE
— With the continuing downscaling of microelectronic technology, chip reliability becomes a great threat to the design of future complex microelectronic systems. Hence increasing...
ICDCS
2000
IEEE
15 years 2 months ago
2000
IEEE
To assure dependable onboard evolution, we have developed a methodology called guarded software upgrading (GSU). In this paper, we focus on a low-cost approach to error containmen...