In this paper, a methodology for generating VHDL descriptions of hardware checkers is presented. It is shown how the methodology can be used to generate on-line checkers of commun...
Diagnosing multiple faults for a complex system is often very difficult. It requires not only a model which adequately represents the diagnostic aspect of a complex system, but al...
Manufacturing processes are a key source of faults in complex hardware systems. Minimizing this impact of manufacturing uncertainties is one way towards achieving fault tolerant s...
Very deep submicron and nanometer technologies have increased notably integrated circuit (IC) sensitiveness to radiation. Soft errors are currently appearing into ICs working at e...
Researchers have made great strides in improving the fault tolerance of both centralized and replicated systems against arbitrary (Byzantine) faults. However, there are hard limit...
Byung-Gon Chun, Petros Maniatis, Scott Shenker, Jo...