As transistor dimensions continue to scale deep into the nanometer regime, silicon reliability is becoming a chief concern. At the same time, transistor counts are scaling up, ena...
Andrew DeOrio, Konstantinos Aisopos, Valeria Berta...
Abstract. Sensor relocation protocols can be employed as fault tolerance approach to offset the coverage loss caused by node failures. We introduce a novel localized structure, in...
Current processor allocation techniques for multicomputers are based on centralized front-end based algorithms. As a result, the applied strategies are usually restricted to stati...
Rose Rose, Hans-Ulrich Heiss, Philippe Olivier Ale...
We present a distributed protocol for maintaining a maximum flow spanning tree in a network, with a designated node as the root of the tree. This maximum flow spanning tree can be...
Negative bias temperature instability (NBTI) has become a dominant reliability concern for nanoscale PMOS transistors. In this paper, we propose variable-latency adder (VL-adder) ...