56 search results - page 5 / 12 » Fault Tolerant External Memory Algorithms |
84
Voted
ICCAD
2005
IEEE
15 years 6 months ago
2005
IEEE
— Yield improvement through exploiting fault-free sections of defective chips is a well-known technique [1][2]. The idea is to partition the circuitry of a chip in a way that fau...
EUSFLAT
2009
14 years 7 months ago
2009
This paper presents SaM, a split and merge algorithm for frequent item set mining. Its distinguishing qualities are an exceptionally simple algorithm and data structure, which not ...
DAC
2009
ACM
15 years 10 months ago
2009
ACM
The use of Flash memories in portable embedded systems is ever increasing. This is because of the multi-level storage capability that makes them excellent candidates for high dens...
107
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HPDC
2009
IEEE
15 years 4 months ago
2009
IEEE
Long running High Performance Computing (HPC) applications at scale must be able to tolerate inevitable faults if they are to harness current and future HPC systems. Message Passi...
DAC
2003
ACM
15 years 10 months ago
2003
ACM
Reseeding is used to improve fault coverage of pseudorandom testing. The seed corresponds to the initial state of the PRPG before filling the scan chain. In this paper, we present...