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VLSID
2001
IEEE
164views VLSI» more  VLSID 2001»
15 years 10 months ago
An Efficient Parallel Transparent Bist Method For Multiple Embedded Memory Buffers
In this paper, we propose a new transparent built-in self-test ( TBIST ) method to test multiple embedded memory arrays with various sizes in parallel. First, a new transparent tes...
Der-Cheng Huang, Wen-Ben Jone, Sunil R. Das
CASES
2009
ACM
15 years 2 months ago
Complete nanowire crossbar framework optimized for the multi-spacer patterning technique
Nanowire crossbar circuits are an emerging architectural paradigm that promises a higher integration density and an improved fault-tolerance due to its reconfigurability. In this...
M. Haykel Ben Jamaa, Gianfranco Cerofolini, Yusuf ...
ICPP
2007
IEEE
15 years 3 months ago
A Meta-Learning Failure Predictor for Blue Gene/L Systems
The demand for more computational power in science and engineering has spurred the design and deployment of ever-growing cluster systems. Even though the individual components use...
Prashasta Gujrati, Yawei Li, Zhiling Lan, Rajeev T...
CASES
2006
ACM
15 years 1 months ago
Cost-efficient soft error protection for embedded microprocessors
Device scaling trends dramatically increase the susceptibility of microprocessors to soft errors. Further, mounting demand for embedded microprocessors in a wide array of safety c...
Jason A. Blome, Shantanu Gupta, Shuguang Feng, Sco...
SSS
2009
Springer
123views Control Systems» more  SSS 2009»
15 years 4 months ago
Scalable P2P Overlays of Very Small Constant Degree: An Emerging Security Threat
In recent years peer-to-peer (P2P) technology has been adopted by Internet-based malware as a fault tolerant and scalable communication medium for self-organization and survival. I...
Márk Jelasity, Vilmos Bilicki