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» Fault emulation: a new approach to fault grading
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DAC
2010
ACM
15 years 5 months ago
Scalable specification mining for verification and diagnosis
Effective system verification requires good specifications. The lack of sufficient specifications can lead to misses of critical bugs, design re-spins, and time-to-market slips. I...
Wenchao Li, Alessandro Forin, Sanjit A. Seshia
DEBS
2008
ACM
15 years 3 months ago
Event-based constraints for sensornet programming
We propose a sensornet programming model based on declarative spatio-temporal constraints on events only, not sensors. Where previous approaches conflate events and sensors becaus...
Jie Mao, John Jannotti, Mert Akdere, Ugur Ç...
OSDI
1996
ACM
15 years 3 months ago
Microkernels Meet Recursive Virtual Machines
This paper describes a novel approach to providingmodular and extensible operating system functionality and encapsulated environments based on a synthesis of microkernel and virtu...
Bryan Ford, Mike Hibler, Jay Lepreau, Patrick Tull...
TCAD
2008
172views more  TCAD 2008»
15 years 1 months ago
General Methodology for Soft-Error-Aware Power Optimization Using Gate Sizing
Power consumption has emerged as the premier and most constraining aspect in modern microprocessor and application-specific designs. Gate sizing has been shown to be one of the mos...
Foad Dabiri, Ani Nahapetian, Tammara Massey, Miodr...
TNN
2008
124views more  TNN 2008»
15 years 1 months ago
Just-in-Time Adaptive Classifiers - Part II: Designing the Classifier
Aging effects, environmental changes, thermal drifts, and soft and hard faults affect physical systems by changing their nature and behavior over time. To cope with a process evolu...
Cesare Alippi, Manuel Roveri