153 search results - page 15 / 31 » Fault origin adjudication |
ASPDAC
1998
ACM
15 years 4 months ago
1998
ACM
— Test Pattern Generation for combinational circuits entails the identification of primary input assignments for detecting each fault in a set of target faults. An extension to ...
104
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CLUSTER
2004
IEEE
15 years 3 months ago
2004
IEEE
Fault tolerance is a very important concern for critical high performance applications using the MPI library. Several protocols provide automatic and transparent fault detection a...
ISCAS
1999
IEEE
15 years 4 months ago
1999
IEEE
An FPGA-based reconfigurable system may contain boards of FPGAs which are reconfigured for different applications and must work correctly. This paper presents a novel approach for...
141
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EVOW
1999
Springer
15 years 4 months ago
1999
Springer
A technique is proposed to reduce the peak power consumption of sequential circuits during test pattern application. High-speed computation intensive VLSI systems, as telecommunica...
OPODIS
2007
15 years 1 months ago
2007
Network overlays have been the subject of intensive research in recent years. The paper presents an overlay structure, S-Fireflies, that is self-stabilizing and is robust against ...