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» Fault tolerant mechanism design
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ASPLOS
2009
ACM
16 years 15 days ago
Mixed-mode multicore reliability
Future processors are expected to observe increasing rates of hardware faults. Using Dual-Modular Redundancy (DMR), two cores of a multicore can be loosely coupled to redundantly ...
Philip M. Wells, Koushik Chakraborty, Gurindar S. ...
ISCA
2010
IEEE
199views Hardware» more  ISCA 2010»
15 years 3 months ago
Use ECP, not ECC, for hard failures in resistive memories
As leakage and other charge storage limitations begin to impair the scalability of DRAM, non-volatile resistive memories are being developed as a potential replacement. Unfortunat...
Stuart E. Schechter, Gabriel H. Loh, Karin Straus,...
GLVLSI
2003
IEEE
132views VLSI» more  GLVLSI 2003»
15 years 5 months ago
A highly regular multi-phase reseeding technique for scan-based BIST
In this paper a novel reseeding architecture for scan-based BIST, which uses an LFSR as TPG, is proposed. Multiple cells of the LFSR are utilized as sources for feeding the scan c...
Emmanouil Kalligeros, Xrysovalantis Kavousianos, D...
ISQED
2002
IEEE
106views Hardware» more  ISQED 2002»
15 years 4 months ago
Trading off Reliability and Power-Consumption in Ultra-low Power Systems
Critical systems like pace-makers, defibrillators, wearable computers and other electronic gadgets have to be designed not only for reliability but also for ultra-low power consu...
Atul Maheshwari, Wayne Burleson, Russell Tessier
CF
2009
ACM
14 years 9 months ago
High accuracy failure injection in parallel and distributed systems using virtualization
Emulation sits between simulation and experimentation to complete the set of tools available for software designers to evaluate their software and predict behavior under condition...
Thomas Hérault, Thomas Largillier, Sylvain ...