936 search results - page 68 / 188 » Fault tolerant mechanism design |
DATE
2008
IEEE
15 years 6 months ago
2008
IEEE
— Market and customer demands have continued to push the limits of CMOS performance. At-speed test has become a common method to ensure these high performance chips are being shi...
DSD
2006
IEEE
15 years 6 months ago
2006
IEEE
In this paper we present an approach for the mapping optimization of fault-tolerant embedded systems for safetycritical applications. Processes and messages are statically schedul...
HPCA
2003
IEEE
16 years 7 days ago
2003
IEEE
A challenging issue in today's server systems is to transparently deal with failures and application-imposed requirements for continuous operation. In this paper we address t...
ICCD
2006
IEEE
15 years 8 months ago
2006
IEEE
Abstract— The continuing divergence of processor and memory speeds has led to the increasing reliance on larger caches which have become major consumers of area and power in embe...
MSS
2007
IEEE
15 years 6 months ago
2007
IEEE
TPT-RAID is a multi-box RAID wherein each ECC group comprises at most one block Jrom any given storage box, and can thus tolerate a boxJailure. It extends the idea ojan out-oj-ban...