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ICIP
2004
IEEE
16 years 4 months ago
Feature selection for subject identification in surveillance photos
He Wang, Konstantinos N. Plataniotis, Anastasios N...
ICPR
2002
IEEE
16 years 4 months ago
Beam Search for Feature Selection in Automatic SVM Defect Classification
Puneet Gupta, David S. Doermann, Daniel DeMenthon
ICPR
2000
IEEE
16 years 4 months ago
Feature Selection for Support Vector Machines
Lothar Hermes, Joachim M. Buhmann