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TCAD
2002
135views more  TCAD 2002»
15 years 3 months ago
Area fill synthesis for uniform layout density
Chemical-mechanical polishing (CMP) and other manufacturing steps in very deep submicron VLSI have varying effects on device and interconnect features, depending on local character...
Yu Chen, Andrew B. Kahng, Gabriel Robins, Alexande...
CVPR
2004
IEEE
16 years 5 months ago
Value Directed Learning of Gestures and Facial Displays
This paper presents a method for learning decision theoretic models of facial expressions and gestures from video data. We consider that the meaning of a facial display or gesture...
Jesse Hoey, James J. Little
ISBI
2006
IEEE
16 years 4 months ago
Use of 3-D cortical morphometry for mapping increased cortical gyrification and complexity in Williams syndrome
In this paper, we describe the use of three different shape measures -- i.e., shape index, curvedness, and L2 norm of mean curvature -- to quantify cortical gyrification and compl...
Duygu Tosun, Allan L. Reiss, Agatha D. Lee, Rebecc...
IEEEARES
2010
IEEE
15 years 10 months ago
External Insider Threat: A Real Security Challenge in Enterprise Value Webs
—Increasingly, organizations collaborate with other organizations in value webs with various arrangements, such as outsourcing, partnering, joint ventures, or subcontracting. As ...
Virginia N. L. Franqueira, André van Cleeff...
SAC
2010
ACM
15 years 10 months ago
Ontology-based generation of IT-security metrics
Legal regulations and industry standards require organizations to measure and maintain a specified IT-security level. Although several IT-security metrics approaches have been de...
Stefan Fenz