172 search results - page 2 / 35 » FinFET-based SRAM design |
JCP
2008
14 years 11 months ago
2008
Semiconductor manufacturing process scaling increases leakage and transistor variations, both of which are problematic for static random access memory (SRAM). Since SRAM is a criti...
106
Voted
DFT
2004
IEEE
15 years 3 months ago
2004
IEEE
This paper proposes a test architecture aimed at reducing test time of distributed small embedded SRAMs (eSRAMs). This architecture improves the one proposed in [4, 5]. The improv...
89
Voted
ETS
2010
IEEE
14 years 10 months ago
2010
IEEE
ÑIn this paper, we present a comparative study on the effects of resistive-bridging defects in the SRAM core-cells, considering different technology nodes. In particular, we analy...
95
Voted
ISLPED
2010
ACM
14 years 12 months ago
2010
ACM
The on-chip memory is a dominant source of power and energy consumption in modern and future processors. This paper explores the use of a new emerging non-volatile memory technolo...
101
Voted
ISQED
2010
IEEE
15 years 1 months ago
2010
IEEE
A new SRAM design is proposed. Body biasing improves the static noise margin (SNM) improved by at least 15% compared to the standard cells. Through using this technique, lowering ...