1999 search results - page 83 / 400 » Finding Reductions Automatically |
DAC
2004
ACM
15 years 11 months ago
2004
ACM
Scan-based silicon debug is a technique that can be used to help find design errors in prototype silicon more quickly. One part of this technique involves the inclusion of breakpo...
ICML
2007
IEEE
15 years 10 months ago
2007
IEEE
This paper investigates the problem of automatically learning how to restructure the reward function of a Markov decision process so as to speed up reinforcement learning. We begi...
CBMS
2006
IEEE
15 years 4 months ago
2006
IEEE
In this era of cross-sectional imaging, it is useful to think of the neck in terms of adjacent anatomical spaces separated by fascial layers extended from the skull base to the th...
UIST
2006
ACM
15 years 3 months ago
2006
ACM
Systems of connected appliances, such as home theaters and presentation rooms, are becoming commonplace in our homes and workplaces. These systems are often difficult to use, in p...
SG
2005
Springer
15 years 3 months ago
2005
Springer
: Cross-sectioning is a popular method for visualizing the complicated inner structures of three-dimensional volume datasets. However, the process is usually manual, meaning that a...