613 search results - page 44 / 123 » Finding and Fixing Faults |
ICCAD
2001
IEEE
15 years 8 months ago
2001
IEEE
Given a test set for stuck-at faults, some of primary input values may be changed to opposite logic values without losing fault coverage. We can regard such input values as don’...
ISSRE
2003
IEEE
15 years 5 months ago
2003
IEEE
Partition testing is a well-known software testing technique. This paper shows that partition testing strategies are relatively ineffective in detecting faults related to small sh...
ATS
1998
IEEE
15 years 4 months ago
1998
IEEE
In mixed-mode BIST, deterministic test patterns are generated with on-chip hardware to detect the random-pattern-resistant (r.p.r.) faults that are missed by the pseudo-random pat...
OSDI
1996
ACM
15 years 1 months ago
1996
ACM
Today's extensible operating systems allow applications to modify kernel behavior by providing mechanisms for application code to run in the kernel address space. The advanta...
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SIAMJO
2008
14 years 11 months ago
2008
Let A and B be nonempty, convex and closed subsets of a Hilbert space H. In the practical considerations we need to find an element of the intersection A B or, more general, to s...