613 search results - page 58 / 123 » Finding and Fixing Faults |
ICSE
2009
IEEE-ACM
16 years 20 days ago
2009
IEEE-ACM
Code cloning is not only assumed to inflate maintenance costs but also considered defect-prone as inconsistent changes to code duplicates can lead to unexpected behavior. Conseque...
73
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CHI
2008
ACM
16 years 7 days ago
2008
ACM
Passwords are ubiquitous, and users and service providers alike rely on them for their security. However, good passwords may sometimes be hard to remember. For years, security pra...
RE
2005
Springer
15 years 5 months ago
2005
Springer
Defect reports generated for faults found during testing provide a rich source of information regarding problematic phrases used in requirements documents. These reports indicate ...
ISCA
2002
IEEE
15 years 4 months ago
2002
IEEE
Exponential growth in the number of on-chip transistors, coupled with reductions in voltage levels, makes each generation of microprocessors increasingly vulnerable to transient f...
106
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ICCAD
1995
IEEE
15 years 3 months ago
1995
IEEE
Implementing a built-in self-test by a "test per clock" scheme offers advantages concerning fault coverage, detection of delay faults, and test application time. Such a ...