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ISQED
2005
IEEE
68views Hardware» more  ISQED 2005»
15 years 8 months ago
Modeling Within-Die Spatial Correlation Effects for Process-Design Co-Optimization
Paul Friedberg, Yu Cao, Jason Cain, Ruth Wang, Jan...
ISSRE
2005
IEEE
15 years 8 months ago
Modeling the Vulnerability Discovery Process
Omar H. Alhazmi, Yashwant K. Malaiya