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ICCAD
2010
IEEE
125views Hardware» more  ICCAD 2010»
14 years 10 months ago
Peak current reduction by simultaneous state replication and re-encoding
Reducing circuit's peak current plays an important role in circuit reliability in deep sub-micron era. For sequential circuits, it is observed that the peak current has a str...
Junjun Gu, Gang Qu, Lin Yuan, Qiang Zhou
ISSRE
2002
IEEE
15 years 5 months ago
A Case Study Using the Round-Trip Strategy for State-Based Class Testing
A number of strategies have been proposed for state-based class testing. An important proposal was made by Chow [5] and adapted by Binder [3]: It consists in deriving test sequenc...
Giuliano Antoniol, Lionel C. Briand, Massimiliano ...
DEDS
2002
119views more  DEDS 2002»
15 years 8 days ago
Diagnosing Discrete-Event Systems: Extending the "Diagnoser Approach" to Deal with Telecommunication Networks
Abstract. Detection and isolation of failures in large and complex systems such as telecommunication networks are crucial and challenging tasks. The problem considered here is that...
Laurence Rozé, Marie-Odile Cordier
PTS
2007
99views Hardware» more  PTS 2007»
15 years 1 months ago
Testing Input/Output Partial Order Automata
Abstract. We propose an extension of the Finite State Machine framework in distributed systems, using input/output partial order automata (IOPOA). In this model, transitions can be...
Stefan Haar, Claude Jard, Guy-Vincent Jourdan