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DAC
2009
ACM
16 years 25 days ago
Statistical reliability analysis under process variation and aging effects
Circuit reliability is affected by various fabrication-time and run-time effects. Fabrication-induced process variation has significant impact on circuit performance and reliabilit...
Yinghai Lu, Li Shang, Hai Zhou, Hengliang Zhu, Fan...
DAC
2009
ACM
16 years 25 days ago
Dynamic thermal management via architectural adaptation
Exponentially rising cooling/packaging costs due to high power density call for architectural and software-level thermal management. Dynamic thermal management (DTM) techniques co...
Ramkumar Jayaseelan, Tulika Mitra
DAC
2008
ACM
16 years 25 days ago
ELIAD: efficient lithography aware detailed router with compact post-OPC printability prediction
In this paper, we present ELIAD, an efficient lithography aware detailed router to optimize silicon image after optical proximity correction (OPC) in a correct-by-construction man...
Minsik Cho, Kun Yuan, Yongchan Ban, David Z. Pan
DAC
2000
ACM
16 years 24 days ago
Can recursive bisection alone produce routable placements?
This work focuses on congestion-driven placement of standard cells into rows in the fixed-die context. We summarize the stateof-the-art after two decades of research in recursive ...
Andrew E. Caldwell, Andrew B. Kahng, Igor L. Marko...
DAC
2002
ACM
16 years 24 days ago
Design of a high-throughput low-power IS95 Viterbi decoder
The design of high-throughput large-state Viterbi decoders relies on the use of multiple arithmetic units. The global communication channels among these parallel processors often ...
Xun Liu, Marios C. Papaefthymiou
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