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DAC
2009
ACM
16 years 3 months ago
Statistical reliability analysis under process variation and aging effects
Circuit reliability is affected by various fabrication-time and run-time effects. Fabrication-induced process variation has significant impact on circuit performance and reliabilit...
Yinghai Lu, Li Shang, Hai Zhou, Hengliang Zhu, Fan...
138
Voted
DAC
2009
ACM
16 years 3 months ago
Dynamic thermal management via architectural adaptation
Exponentially rising cooling/packaging costs due to high power density call for architectural and software-level thermal management. Dynamic thermal management (DTM) techniques co...
Ramkumar Jayaseelan, Tulika Mitra
DAC
2008
ACM
16 years 3 months ago
ELIAD: efficient lithography aware detailed router with compact post-OPC printability prediction
In this paper, we present ELIAD, an efficient lithography aware detailed router to optimize silicon image after optical proximity correction (OPC) in a correct-by-construction man...
Minsik Cho, Kun Yuan, Yongchan Ban, David Z. Pan
99
Voted
DAC
2000
ACM
16 years 3 months ago
Can recursive bisection alone produce routable placements?
This work focuses on congestion-driven placement of standard cells into rows in the fixed-die context. We summarize the stateof-the-art after two decades of research in recursive ...
Andrew E. Caldwell, Andrew B. Kahng, Igor L. Marko...
DAC
2002
ACM
16 years 3 months ago
Design of a high-throughput low-power IS95 Viterbi decoder
The design of high-throughput large-state Viterbi decoders relies on the use of multiple arithmetic units. The global communication channels among these parallel processors often ...
Xun Liu, Marios C. Papaefthymiou
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