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IOLTS
2003
IEEE
124views Hardware» more  IOLTS 2003»
15 years 9 months ago
The positive effect on IC yield of embedded Fault Tolerance for SEUs
Fault tolerant design is a technique emerging in Integrated Circuits (IC’s) to deal with the increasing error susceptibility (Soft Errors, or Single Event Upsets, SEU) caused by...
André K. Nieuwland, Richard P. Kleihorst
AOSD
2007
ACM
15 years 8 months ago
Open bisimulation for aspects
We define and study bisimulation for proving contextual equivalence in an aspect extension of the untyped lambda-calculus. To our knowledge, this is the first study of coinductive...
Radha Jagadeesan, Corin Pitcher, James Riely
SLOGICA
2011
14 years 11 months ago
Logics for Qualitative Inductive Generalization
The paper contains a survey of (mainly unpublished) adaptive logics of inductive generalization. These defeasible logics are precise formulations of certain methods. Some attentio...
Diderik Batens
SIGSOFT
2009
ACM
15 years 10 months ago
MSeqGen: object-oriented unit-test generation via mining source code
An objective of unit testing is to achieve high structural coverage of the code under test. Achieving high structural coverage of object-oriented code requires desirable method-ca...
Suresh Thummalapenta, Tao Xie, Nikolai Tillmann, J...
AOSD
2006
ACM
15 years 10 months ago
Presenting crosscutting structure with active models
When modifying or debugging a software system, among other tasks, developers must often understand and manipulate source code that crosscuts the system’s structure. These tasks ...
Wesley Coelho, Gail C. Murphy