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152
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DATE
2010
IEEE
15 years 7 months ago
2010
IEEE
We model and verify analog designs in the presence of noise and process variation using an automated theorem prover, MetiTarski. Due to the statistical nature of noise, we propose ...
112
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EURODAC
1994
IEEE
15 years 7 months ago
1994
IEEE
This paper addresses the problem of design rule correct routing, i.e. the avoidance of illegal wiring patterns during routing. These illegal wiring patterns are due to the set of ...
101
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ECOOPW
1999
Springer
15 years 7 months ago
1999
Springer
In this paper, we describe a method for the composition of components that are relatively correct under a particular criterion. The notion of composition pattern is also introduce...
111
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VLSID
2003
IEEE
16 years 3 months ago
2003
IEEE
This paper introduces a Built-In Self Test (BIST) structure referred to as Universal BIST (UBIST). The Test Pattern Generator (TPG) of the proposed UBIST is designed to generate an...
106
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ICRA
2005
IEEE
15 years 8 months ago
2005
IEEE
– We describe in detail the behavior of an inhibitory Central Pattern Generator (CPG) network for robot control. A four-neuron, mutual inhibitory network forms the basic coordina...