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DAC
2009
ACM
16 years 4 months ago
Double patterning lithography friendly detailed routing with redundant via consideration
In double patterning lithography (DPL), coloring conflict and stitch minimization are the two main challenges. Post layout decomposition algorithm [1] [2]may not be enough to achi...
Kun Yuan, Katrina Lu, David Z. Pan
108
Voted
DATE
2003
IEEE
108views Hardware» more  DATE 2003»
15 years 9 months ago
EBIST: A Novel Test Generator with Built-In Fault Detection Capability
Abstract : A novel design methodology for test pattern generation in BIST is presented. Here faults and errors in the generator itself are detected. Two different design methodolog...
Dhiraj K. Pradhan, Chunsheng Liu, Krishnendu Chakr...
130
Voted
ECOOP
2008
Springer
15 years 5 months ago
Exploring Role Based Adaptation
The adapter design pattern [1], commonly used for integration and evolution in component-based systems, is originally described by roles. In classbased systems, the conventional re...
Sebastian Goetz, Ilie Savga
ICDCS
2005
IEEE
15 years 9 months ago
Controlling Gossip Protocol Infection Pattern Using Adaptive Fanout
We propose and evaluate a model for controlling infection patterns defined over rounds or real time in a gossipbased protocol using adaptive fanout. We model three versions of go...
Satish Verma, Wei Tsang Ooi
WWW
2008
ACM
16 years 4 months ago
Query-sets: using implicit feedback and query patterns to organize web documents
In this paper we present a new document representation model based on implicit user feedback obtained from search engine queries. The main objective of this model is to achieve be...
Barbara Poblete, Ricardo A. Baeza-Yates