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TCAD
2008
14 years 10 months ago
2008
As the technology node advances into the nanometer era, via-open defects are one of the dominant failures due to the copper cladding process. To improve via yield and reliability, ...
ATMOS
2010
14 years 9 months ago
2010
Train Routing is a problem that arises in the early phase of the passenger railway planning process, usually several months before operating the trains. The main goal is to assign...
INFOCOM
2010
IEEE
14 years 8 months ago
2010
IEEE
—Despite much research on the throughput of relaying networks under idealized interference models, many practical wireless networks rely on physical-layer protocols that preclude...
GLVLSI
2009
IEEE
15 years 4 months ago
2009
IEEE
The miniaturization of transistors in recent technology nodes requires tremendous back-end tuning and optimizations, making bug fixing at later design stages more expensive. Ther...
DAC
2009
ACM
15 years 11 months ago
2009
ACM
Circuit reliability is affected by various fabrication-time and run-time effects. Fabrication-induced process variation has significant impact on circuit performance and reliabilit...