36320 search results - page 7045 / 7264 » From Code to Models |
161
click to vote
ICCD
2008
IEEE
16 years 1 months ago
2008
IEEE
— Verification remains an integral and crucial phase of today’s microprocessor design and manufacturing process. Unfortunately, with soaring design complexities and decreasing...
142
click to vote
ICCD
2007
IEEE
16 years 1 months ago
2007
IEEE
This paper proposes an efficient analysis flow and an algorithm to identify the worst case noise for power networks with multiple clock domains. First, we apply the Laplace transf...
130
click to vote
ICCAD
2007
IEEE
16 years 1 months ago
2007
IEEE
Abstract— Thermal issues are a primary concern in the threedimensional (3D) integrated circuit (IC) design. Temperature, area, and wire length must be simultaneously optimized du...
138
click to vote
SOSP
2005
ACM
16 years 1 months ago
2005
ACM
Commodity file systems trust disks to either work or fail completely, yet modern disks exhibit more complex failure modes. We suggest a new fail-partial failure model for disks, ...
139
click to vote
MMM
2009
Springer
16 years 1 months ago
2009
Springer
—In this paper, we have developed a novel framework called JustClick to enable personalized image recommendation via exploratory search from large-scale collections of manuallyan...