36 search results - page 1 / 8 » Fully Automatic Test Program Generation for Microprocessor C... |
DATE
2003
IEEE
15 years 2 months ago
2003
IEEE
GECCO
2005
Springer
15 years 3 months ago
2005
Springer
Checking if microprocessor cores are fully functional at the end of the productive process has become a major issue. Traditional functional approaches are not sufficient when cons...
118
Voted
SBCCI
2005
ACM
15 years 3 months ago
2005
ACM
Higher integration densities, smaller feature lengths, and other technology advances, as well as architectural evolution, have made microprocessor cores exceptionally complex. Cur...
105
Voted
ISQED
2002
IEEE
15 years 2 months ago
2002
IEEE
The paper addresses the issue of microprocessor and microcontroller testing, and follows an approach based on the generation of a test program. The proposed method relies on two p...
ICTAI
2000
IEEE
15 years 1 months ago
2000
IEEE