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131
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DAC
2003
ACM
16 years 3 months ago
2003
ACM
As minimum feature sizes continue to shrink, patterned features have become significantly smaller than the wavelength of light used in optical lithography. As a result, the requir...
130
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ICML
2007
IEEE
16 years 3 months ago
2007
IEEE
We describe and analyze a simple and effective iterative algorithm for solving the optimization problem cast by Support Vector Machines (SVM). Our method alternates between stocha...
110
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KDD
2006
ACM
16 years 2 months ago
2006
ACM
Observed in many applications, there is a potential need of extracting a small set of frequent patterns having not only high significance but also low redundancy. The significance...
115
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STACS
2010
Springer
15 years 9 months ago
2010
Springer
Let (V, δ) be a finite metric space, where V is a set of n points and δ is a distance function defined for these points. Assume that (V, δ) has a constant doubling dimension d...
131
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ISSTA
2009
ACM
15 years 9 months ago
2009
ACM
Bug localization has attracted a lot of attention recently. Most existing methods focus on pinpointing a single statement or function call which is very likely to contain bugs. Al...