13 search results - page 3 / 3 » Functional Coverage Driven Test Generation for Validation of... |
VLSID
2007
IEEE
14 years 6 months ago
2007
IEEE
Functional validation of microprocessors is growing in complexity in current and future microprocessors. Traditionally, the different components (or validation collaterals) used i...
VLSID
2000
IEEE
13 years 10 months ago
2000
IEEE
We address the problem of verifying the correctness of pre-silicon models of a microprocessor. We touch on the latest advances in this area by considering two different aspects of...
TVLSI
2008
13 years 5 months ago
2008
With increasing levels of integration of multiple processing cores and new features to support software functionality, recent generations of microprocessors face difficult validati...