192 search results - page 18 / 39 » Functional Scan Chain Testing |
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ATS
2005
IEEE
15 years 5 months ago
2005
IEEE
Abstract—This paper presents a low transition test pattern generator, called LT-LFSR, to reduce average and peak power of a circuit during test by reducing the transitions within...
IVS
2006
14 years 11 months ago
2006
In this paper, we explore a privacy algorithm that detects human private parts in a 3D scan data set. The analogia graph is introduced to study the proportion of structures. The i...
ICDAR
2009
IEEE
15 years 6 months ago
2009
IEEE
In this paper, we present a new approach to the temporal order restoration of the off-line handwriting. After the preprocessing steps of the word image, a suitable algorithm makes...
DATE
2005
IEEE
15 years 5 months ago
2005
IEEE
Abstract—On a commercial digital still camera (DSC) controller chip we practice a novel SOC test integration platform, solving real problems in test scheduling, test IO reduction...
VTS
2003
IEEE
15 years 5 months ago
2003
IEEE
—We present a dictionary-based test data compression approach for reducing test data volume and testing time in SOCs. The proposed method is based on the use of a small number of...