192 search results - page 22 / 39 » Functional Scan Chain Testing |
ITC
2003
IEEE
15 years 5 months ago
2003
IEEE
This paper presents an approach for analysis of system state differences observable through the scan chain for the debug of functional failures. A novel methodology for Latch Dive...
ITC
2003
IEEE
15 years 5 months ago
2003
IEEE
When developing new designs, debugging the prototype is important to resolve application malfunction. During this board design debug, often a few pins of an IC are measured to che...
100
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CVBIA
2005
Springer
15 years 5 months ago
2005
Springer
In non-rigid image registration problems, it can be difficult to construct a single cost function that adequately captures concepts of similarity for multiple structures, for examp...
88
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ISSAC
2009
Springer
15 years 6 months ago
2009
Springer
The computation of triangular decompositions involves two fundamental operations: polynomial GCDs modulo regular chains and regularity test modulo saturated ideals. We propose new...
104
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CEC
2009
IEEE
15 years 4 months ago
2009
IEEE
— This work presents a methodology for the application of a parallel genetic algorithm (PGA) to the problem of protein folding prediction, using the 3DHP-Side Chain model. This m...