192 search results - page 24 / 39 » Functional Scan Chain Testing |
107
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VTS
2000
IEEE
15 years 5 months ago
2000
IEEE
1 This paper addresses the problem of testing path delay faults in a microprocessor using instructions. It is observed that a structurally testable path (i.e., a path testable thro...
105
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ACMSE
2008
ACM
15 years 3 months ago
2008
ACM
With stock surpluses and shortages representing one of the greatest elements of risk to wholesalers, a solution to the multiretailer supply chain management problem would result i...
122
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BMCBI
2006
15 years 1 months ago
2006
Background: The subcellular location of a protein is closely related to its function. It would be worthwhile to develop a method to predict the subcellular location for a given pr...
103
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BMCBI
2007
15 years 1 months ago
2007
Background: With the popularisation of high-throughput techniques, the need for procedures that help in the biological interpretation of results has increased enormously. Recently...
VTS
2005
IEEE
15 years 7 months ago
2005
IEEE
This paper presents a pseudo-functional BIST scheme that attempts to minimize the over-testing problem of logic BIST for delay and crosstalk-induced failures. The over-testing pro...