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ITC
2000
IEEE
84views Hardware» more  ITC 2000»
15 years 1 months ago
Non-intrusive BIST for systems-on-a-chip
1 The term "functional BIST" describes a test method to control functional modules so that they generate a deterministic test set, which targets structural faults within ...
Silvia Chiusano, Paolo Prinetto, Hans-Joachim Wund...
176
Voted
POPL
2009
ACM
15 years 10 months ago
SPEED: precise and efficient static estimation of program computational complexity
This paper describes an inter-procedural technique for computing symbolic bounds on the number of statements a procedure executes in terms of its scalar inputs and user-defined qu...
Sumit Gulwani, Krishna K. Mehra, Trishul M. Chilim...
ICCV
2005
IEEE
15 years 11 months ago
Efficient Learning of Relational Object Class Models
We present an efficient method for learning part-based object class models from unsegmented images represented as sets of salient features. A model includes parts' appearance...
Aharon Bar-Hillel, Tomer Hertz, Daphna Weinshall
145
Voted

Book
640views
16 years 8 months ago
Introduction to Pattern Recognition
"Pattern recognition techniques are concerned with the theory and algorithms of putting abstract objects, e.g., measurements made on physical objects, into categories. Typical...
Sargur Srihari
KAIS
2006
110views more  KAIS 2006»
14 years 9 months ago
Multi-step density-based clustering
Abstract. Data mining in large databases of complex objects from scientific, engineering or multimedia applications is getting more and more important. In many areas, complex dista...
Stefan Brecheisen, Hans-Peter Kriegel, Martin Pfei...