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128
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ICCAD
2002
IEEE
116views Hardware» more  ICCAD 2002»
16 years 13 days ago
Conflict driven techniques for improving deterministic test pattern generation
This work presents several new techniques for enhancing the performance of deterministic test pattern generation for VLSI circuits. The techniques introduced are called dynamic de...
Chen Wang, Sudhakar M. Reddy, Irith Pomeranz, Xiji...
126
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DELTA
2002
IEEE
15 years 8 months ago
Test Chirp Signal Generation Using Spectral Warping
A DSP technique that transforms a digital signal by warping the frequency axis is discussed. The technique corresponds to a mapping of the samples in the z-domain such that they a...
Warwick Allen, Donald G. Bailey, Serge N. Demidenk...
156
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ECCV
2010
Springer
15 years 5 months ago
Descriptor Learning for Efficient Retrieval
Many visual search and matching systems represent images using sparse sets of "visual words": descriptors that have been quantized by assignment to the best-matching symb...
133
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PAA
2006
15 years 3 months ago
Efficient median based clustering and classification techniques for protein sequences
Abstract In this paper, an efficient K-medians clustering (unsupervised) algorithm for prototype selection and Supervised K-medians (SKM) classification technique for protein seque...
P. A. Vijaya, M. Narasimha Murty, D. K. Subramania...
ICST
2009
IEEE
15 years 10 months ago
Using JML Runtime Assertion Checking to Automate Metamorphic Testing in Applications without Test Oracles
It is challenging to test applications and functions for which the correct output for arbitrary input cannot be known in advance, e.g. some computational science or machine learni...
Christian Murphy, Kuang Shen, Gail E. Kaiser