Sciweavers

202 search results - page 4 / 41
» Functional Test Generation Using Efficient Property Clusteri...
Sort
View
GLVLSI
2006
IEEE
95views VLSI» more  GLVLSI 2006»
15 years 3 months ago
Test generation using SAT-based bounded model checking for validation of pipelined processors
Functional verification is one of the major bottlenecks in microprocessor design. Simulation-based techniques are the most widely used form of processor verification. Efficient ...
Heon-Mo Koo, Prabhat Mishra
MLDM
2005
Springer
15 years 3 months ago
Using Clustering to Learn Distance Functions for Supervised Similarity Assessment
Assessing the similarity between objects is a prerequisite for many data mining techniques. This paper introduces a novel approach to learn distance functions that maximizes the c...
Christoph F. Eick, Alain Rouhana, Abraham Bagherje...
ITC
1998
IEEE
120views Hardware» more  ITC 1998»
15 years 1 months ago
Test generation in VLSI circuits for crosstalk noise
This paper addresses the problem of efficiently and accurately generating two-vector tests for crosstalk induced effects, such as pulses, signal speedup and slowdown, in digital c...
Weiyu Chen, Sandeep K. Gupta, Melvin A. Breuer
BIOINFORMATICS
2007
151views more  BIOINFORMATICS 2007»
14 years 9 months ago
A new protein-protein docking scoring function based on interface residue properties
Motivation: Protein–protein complexes are known to play key roles in many cellular processes. However, they are often not accessible to experimental study because of their low s...
Julie Bernauer, Jérôme Azé, Jo...
HIS
2008
14 years 11 months ago
Artificial Data Sets Based on Knowledge Generators: Analysis of Learning Algorithms Efficiency
This paper proposes a methodology to generate artificial data sets to evaluate the behavior of machine learning techniques. The methodology relies in the definition of a domain an...
Joaquin Rios-Boutin, Albert Orriols-Puig, Josep Ma...