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TSE
2010
155views more  TSE 2010»
14 years 4 months ago
Incremental Test Generation for Software Product Lines
Recent advances in mechanical techniques for systematic testing have increased our ability to automatically find subtle bugs, and hence to deploy more dependable software. This pap...
Engin Uzuncaova, Sarfraz Khurshid, Don S. Batory
ITC
1997
IEEE
129views Hardware» more  ITC 1997»
15 years 1 months ago
On Using Machine Learning for Logic BIST
This paper presents a new approach for designing test sequences to be generated on–chip. The proposed technique is based on machine learning, and provides a way to generate effi...
Christophe Fagot, Patrick Girard, Christian Landra...
JODL
2006
131views more  JODL 2006»
14 years 9 months ago
Keyframe-based video summarization using Delaunay clustering
Recent advances in technology have made tremendous amount of multimedia information available to the general population. An efficient way of dealing with this new development is t...
Padmavathi Mundur, Yong Rao, Yelena Yesha
ECML
2006
Springer
15 years 1 months ago
Efficient Prediction-Based Validation for Document Clustering
Recently, stability-based techniques have emerged as a very promising solution to the problem of cluster validation. An inherent drawback of these approaches is the computational c...
Derek Greene, Padraig Cunningham
VLSID
2005
IEEE
131views VLSI» more  VLSID 2005»
15 years 10 months ago
Efficient Space/Time Compression to Reduce Test Data Volume and Testing Time for IP Cores
Abstract-- We present two-dimensional (space/time) compression techniques that reduce test data volume and test application time for scan testing of intellectual property (IP) core...
Lei Li, Krishnendu Chakrabarty, Seiji Kajihara, Sh...