174 search results - page 22 / 35 » Functional Test Generation for Full Scan Circuits |
88
Voted
VTS
2005
IEEE
15 years 5 months ago
2005
IEEE
This paper presents a pseudo-functional BIST scheme that attempts to minimize the over-testing problem of logic BIST for delay and crosstalk-induced failures. The over-testing pro...
ASPDAC
2001
ACM
15 years 3 months ago
2001
ACM
In this paper, we o introduce the Reusable Embedded In-Circuit Emulator (EICE) and Reusable EICE development system. The main function in EICE we design are testing and debugging. ...
93
Voted
ITC
1995
IEEE
15 years 3 months ago
1995
IEEE
During built-in self-test (BIST), the set of patterns generated by a pseudo-random pattern generator may not provide a sufficiently high fault coverage. This paper presents a new ...
79
Voted
ITC
1997
IEEE
15 years 3 months ago
1997
IEEE
- An all-digital technique for the measurement of the jitter transfer function of charge-pump phase-locked loops is introduced. Input jitter may be generated using one of two metho...
84
Voted
DSD
2006
IEEE
15 years 5 months ago
2006
IEEE
Recently, a number of works have been published on implementing assignment decision diagram models combined with SAT methods to address register-transfer level test pattern genera...