174 search results - page 25 / 35 » Functional Test Generation for Full Scan Circuits |
111
Voted
ET
2007
15 years 3 months ago
2007
Abstract In order to perform an on-chip test for characterizing both static and transmission parameters of embedded analog-to-digital converters (ADCs), this paper presents an osci...
141
Voted
RTAS
1997
IEEE
15 years 7 months ago
1997
IEEE
ÐThis paper describes MTSim, an extensible, customizable simulation platform for the Modechart toolset (MT). MTSim provides support for ªplugging inº user-defined viewers useful...
132
Voted
VLSI
2007
Springer
15 years 9 months ago
2007
Springer
— Software simulation remains the most used method for VHDL RTL functional verification. The functional verification process essentially consists of two parts. The first one is t...
138
Voted
VLSID
2005
IEEE
15 years 9 months ago
2005
IEEE
During pseudorandom testing, a significant amount of energy and test application time is wasted for generating and for applying “useless” test vectors that do not contribute t...
128
Voted
JEI
2010
15 years 2 months ago
2010
Letter scanning cameras (LSCs) form the front end imaging systems for virtually all mail scanning systems that are currently used to automatically sort mail products. As with any ...