174 search results - page 27 / 35 » Functional Test Generation for Full Scan Circuits |
TCAD
2002
14 years 11 months ago
2002
A test pattern generator (TPG) for built-in self-test (BIST), which can reduce switching activity during test application, is proposed. The proposed TPG, called dual-speed LFSR (DS...
101
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GECCO
2007
Springer
15 years 5 months ago
2007
Springer
The Second Harmonic Generation (SHG), a process that turns out to be a good test case in the physics lab, can also be considered as a fairly simple theoretical test function for g...
ETS
2006
IEEE
15 years 5 months ago
2006
IEEE
BIST is an attractive approach to detect delay faults due to its inherent support for at-speed test. Deterministic logic BIST (DLBIST) is a technique which was successfully applie...
96
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ASPDAC
2004
ACM
15 years 5 months ago
2004
ACM
- Under manufacturing process variation, a path through a fault site is called longest for delay test if there exists a process condition under which the path has the maximum delay...
DAC
2002
ACM
16 years 17 days ago
2002
ACM
At-speed testing of high-speed circuits is becoming increasingly difficult with external testers due to the growing gap between design and tester performance, growing cost of high...