174 search results - page 28 / 35 » Functional Test Generation for Full Scan Circuits |
ISCAS
2008
IEEE
15 years 6 months ago
2008
IEEE
— A precision integrated bandgap voltage reference in 0.35μm CMOS technology is here presented. The circuit uses natural npn bipolar transistors as reference diodes. A particula...
105
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MEMOCODE
2007
IEEE
15 years 5 months ago
2007
IEEE
Due to the rapidly growing speed and the decreasing size of gates in modern chips, the probability of faults caused by the production process grows. Already small variations lead ...
DAC
2003
ACM
16 years 17 days ago
2003
ACM
Software-based self-test (SBST) is an emerging approach to address the challenges of high-quality, at-speed test for complex programmable processors and systems-on chips (SoCs) th...
103
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EUROSYS
2010
ACM
15 years 8 months ago
2010
ACM
The benefits of virtualized IT environments, such as compute clouds, have drawn interested enterprises to migrate their applications onto new platforms to gain the advantages of ...
110
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DIS
2001
Springer
15 years 4 months ago
2001
Springer
In the context of classification problems, algorithms that generate multivariate trees are able to explore multiple representation languages by using decision tests based on a com...