174 search results - page 29 / 35 » Functional Test Generation for Full Scan Circuits |
112
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PPPJ
2006
ACM
15 years 5 months ago
2006
ACM
The JavaTM programming language is primarily used for platform-independent programming. Yet it also offers many productivity, maintainability and performance benefits for platfo...
VTS
2000
IEEE
15 years 4 months ago
2000
IEEE
This paper focuses on observability, one of the open issues in High-Level test generation. Three different approximate metrics for taking observability into account during RT-leve...
125
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TVLSI
2008
14 years 11 months ago
2008
With increasing levels of integration of multiple processing cores and new features to support software functionality, recent generations of microprocessors face difficult validati...
100
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CORR
2007
Springer
14 years 11 months ago
2007
Springer
This paper deals with a common verification methodology and environment for SystemC BCA and RTL models. The aim is to save effort by avoiding the same work done twice by different...
110
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SIGSOFT
2010
ACM
14 years 9 months ago
2010
ACM
The definition of a data structure may permit many different concrete representations of the same logical content. A (client) program that accepts such a data structure as input i...