174 search results - page 32 / 35 » Functional Test Generation for Full Scan Circuits |
FPL
2001
Springer
15 years 4 months ago
2001
Springer
Abstract. Visual data
ow environments are ideally suited for modeling digital signal processing (DSP) systems, as many DSP algorithms are most naturally speci ed by signal
ow gra...
ISLPED
1997
ACM
15 years 3 months ago
1997
ACM
In this paper we present a methodology and techniques for generating cycle-accurate macro-models for RTlevel power analysis. The proposed macro-model predicts not only...
110
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ISCA
2009
IEEE
15 years 6 months ago
2009
IEEE
While Moore’s Law predicts the ability of semi-conductor industry to engineer smaller and more efficient transistors and circuits, there are serious issues not contemplated in t...
107
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BMCBI
2005
14 years 11 months ago
2005
Background: Recent advances in molecular biology techniques provide an opportunity for developing detailed mathematical models of biological processes. An iterative scheme is intr...
GLVLSI
1998
IEEE
15 years 3 months ago
1998
IEEE
In this research, we devised a new simple technique for statically holding analog weights, which does not require periodic refreshing. It further contains a mechanism to locally u...